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MEI Online: Analytical Techniques & Applied Mineralogy: Latest News: August 6th 2008


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:: Bruker AXS Microanalysis to Introduce New EBSD System at M&M 2008

Bruker AXS Microanalysis announced today that it plans to introduce its new QUANTAX CrystAlignTM system for SEM-based crystallographic analysis via electron backscatter diffraction (EBSD) at the Microscopy and Microanalysis (M&M) 2008 Annual Meeting, starting on August 4, 2008 in Albuquerque, NM (USA). The CrystAlign system consists of an ultra-fast EBSD detector and powerful, yet easy-to-use EBSD analysis software that is seamlessly integrated with Bruker’s EDS software ESPRITTM. The combination of EBSD with Energy Dispersive X-ray Spectroscopy (EDS) offers more comprehensive materials characterization capabilities in Scanning Electron Microscopes (SEM) for a broad range of applications on metals, ceramics and geological samples.

Dr. Gert Nolze, EBSD Product Manager at Bruker AXS, commented: “The new Bruker EBSD system CrystAlign provides several innovative capabilities: it features ultra-fast acquisition rates of up to 750 patterns per second with the unique ability of scanning the sample at a constant frame rate and storing the patterns as a string of images for subsequent indexing and evaluation. Acquisition time is thus independent of the sample type, and sample throughput can be maximized. This novel EBSD collection strategy allows re-processing of the data, investigation of individual patterns and re-analysis of the crystal orientation maps without repeated data acquisition."

Thomas Schuelein, Bruker AXS Executive Vice President, stated: “Bruker has reached an important milestone in its microanalysis strategy, aimed at further extending the versatility and analytical power of its product lines for the micro- and nanoanalysis markets. Our novel CrystAlign system complements the capabilities of our QUANTAX EDS system by providing powerful tools for EBSD data acquisition, interpretation and display of results, while making the EBSD technique much more accessible to the general microanalysis and SEM user."




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